Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires

Philosophical Magazine 92 (25-27):3243-3256 (2012)
  Copy   BIBTEX

Abstract

This article has no associated abstract. (fix it)

Links

PhilArchive



    Upload a copy of this work     Papers currently archived: 91,435

External links

Setup an account with your affiliations in order to access resources via your University's proxy server

Through your library

Similar books and articles

The Early History of Insulated Copper Wire.Allan A. Mills - 2004 - Annals of Science 61 (4):453-467.
Yield phenomena in polycrystalline copper.A. L. Titchener & G. J. Davies - 1965 - Philosophical Magazine 11 (114):1225-1232.

Analytics

Added to PP
2016-06-30

Downloads
20 (#756,757)

6 months
6 (#509,020)

Historical graph of downloads
How can I increase my downloads?