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The elastic potential energy of a thin foil deformed by an in-plane 60° dislocation
Philosophical Magazine 87 (31):4935-4948 (2007)
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Citations of this work
The angular dislocation parallel to a free surface. Application to a Si low-angle twist boundary.S. Neily, S. Youssef, F. Fournel & R. Bonnet - 2011 - Philosophical Magazine 91 (31):4001-4012.
Alternate dissociation of the screw dislocations in a buried small-angle twist boundary in silicon.R. Bonnet, M. Loubradou, S. Youssef, J. -L. Rouvière & F. Fournel - 2009 - Philosophical Magazine 89 (5):413-434.
References found in this work
The observation of dissociated dislocations in silicon.I. L. F. Ray & D. J. H. Cockayne - 1970 - Philosophical Magazine 22 (178):853-856.
Sub-angstrom imaging of dislocation core structures: how well are experiments comparable with theory?C. Kisielowski, B. Freitag, X. Xu, S. P. Beckman & D. C. Chrzan - 2006 - Philosophical Magazine 86 (29-31):4575-4588.
Imaging dislocation cores – the way forward.J. C. H. Spence⊥, H. R. Kolar, G. Hembree, C. J. Humphreys, J. Barnard, R. Datta, C. Koch, F. M. Ross & J. F. Justo - 2006 - Philosophical Magazine 86 (29-31):4781-4796.
Silicon surfacial grain boundaries obtained by direct wafer bonding process: Accurate control of the structure before bonding.K. Rousseau *, J. Eymery, F. Fournel, J. -P. Morniroli & J. -L. Rouvière - 2005 - Philosophical Magazine 85 (21):2415-2448.
A dissociated dislocation in an ultrathin silicon plate.S. Youssef & R. Bonnet - 2006 - Philosophical Magazine 86 (20):3077-3088.
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