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  1. Simulations of weak-beam diffraction contrast images of dislocation loops by the many-beam Howie–Basinski equations.Z. Zhou, M. L. Jenkins, S. L. Dudarev, A. P. Sutton & M. A. Kirk - 2006 - Philosophical Magazine 86 (29-31):4851-4881.
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  • Electron microscope observations of stacking faults and microtwins in synthetic diamond.G. S. Woods - 1971 - Philosophical Magazine 23 (182):473-484.
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  • The determination of the sign of the burgers vector of frank dislocation loops.W. J. Tunstall - 1969 - Philosophical Magazine 20 (166):701-705.
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  • Many-beam contrast effects of dislocations.P. Skalicky & A. Papp - 1972 - Philosophical Magazine 25 (1):177-188.
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  • Pénétration des électrons dans les corps de poids atomique élevé sous des tensions accélératrices atteignant 3000 kV cas de l'or et du tantale.C. Roucau & R. Ayroles - 1975 - Philosophical Magazine 31 (2):387-404.
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  • The distribution of intensity in electron diffraction patterns due to phonon scattering.P. Rez, C. J. Humphreys & M. J. Whelan - 1977 - Philosophical Magazine 35 (1):81-96.
  • Effet des reflexions multiples sur le contraste des parois antiphases en microscopic electronique.Par A. Renault, J. M. Penisson & A. Bourret - 1973 - Philosophical Magazine 28 (1):103-132.
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  • Stacking-fault contrast as observed by superlattice dark field in L12γ′.J. M. Oblak - 1971 - Philosophical Magazine 24 (191):1001-1022.
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  • Neutron irradiation damage in molybdenum.D. M. Maher & B. L. Eyre - 1971 - Philosophical Magazine 23 (182):409-438.
  • Neutron irradiation damage in molybdenum.D. M. Maher, M. H. Loretto & A. F. Bartlett - 1971 - Philosophical Magazine 24 (187):181-194.
  • The critical voltage effect in high voltage electron microscopy.J. S. Lally, C. J. Humphreys, A. J. F. Metherell & R. M. Fisher - 1972 - Philosophical Magazine 25 (2):321-343.
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  • Image contrast of triple loops in tellurium-doped gallium arsenide.D. Laistbr & G. M. Jenkins - 1969 - Philosophical Magazine 20 (164):361-372.
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  • The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.
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  • Maximizing the penetration in high voltage electron microscopy.C. J. Humphreys, L. E. Thomas, J. S. Lally & R. M. Fisher - 1971 - Philosophical Magazine 23 (181):87-114.
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  • Inelastic scattering of fast electrons by crystals.C. J. Humphreys & M. J. Whelan - 1969 - Philosophical Magazine 20 (163):165-172.
  • Additional image peaks in the high resolution imaging of dislocations.C. J. Humphreys, R. A. Drummond, A. Hart-Davis & E. P. Butler - 1977 - Philosophical Magazine 35 (6):1543-1555.
  • Phase contrast electron microscopy of amorphous specimens supported on thin crystals.R. L. Hines & A. Howie - 1975 - Philosophical Magazine 32 (2):257-271.
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  • Diffuse scattering in weak-beam images.P. L. Gai & A. Howie - 1975 - Philosophical Magazine 31 (3):519-528.
  • Inelastic scattering and energy filtering in the transmission electron microscope.R. F. Egerton - 1976 - Philosophical Magazine 34 (1):49-65.
  • Inelastic scattering of 80 keV electrons in amorphous carbon.R. F. Egerton - 1975 - Philosophical Magazine 31 (1):199-215.
  • Diffraction contrast from coherent precipitates in elastically-anisotropic materials.H. P. Degischer - 1972 - Philosophical Magazine 26 (5):1137-1151.
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  • Preservation of electron microscope image contrast after inelastic scattering.S. L. Cundy, A. Howie & U. Valdrè - 1969 - Philosophical Magazine 20 (163):147-163.
  • A study of the relationship between lattice fringes and lattice planes in electron microscope images of crystals containing defects.D. J. H. Cockayne, J. R. Parsons & C. W. Hoelke - 1971 - Philosophical Magazine 24 (187):139-153.
  • Calculations of lattice defect images for scanning electron microscopy.D. R. Clarke & A. Howie - 1971 - Philosophical Magazine 24 (190):959-971.
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