A new approach to quantitative and credible diagnosis for multiple faults of components and sensors

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Artificial Intelligence 91 (1):103-130 (1997)
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10.1016/s0004-3702(96)00060-4

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References found in this work

A theory of diagnosis from first principles.Raymond Reiter - 1987 - Artificial Intelligence 32 (1):57-95.
Diagnosing multiple faults.Johan de Kleer & Brian C. Williams - 1987 - Artificial Intelligence 32 (1):97-130.
Causality in device behavior.Yumi Iwasaki & Herbert A. Simon - 1986 - Artificial Intelligence 29 (1):3-32.
Characterizing diagnoses and systems.Johan de Kleer, Alan K. Mackworth & Raymond Reiter - 1992 - Artificial Intelligence 56 (2-3):197-222.
Retrospective on “Causality in device behavior”.Yumi Iwasaki & Herbert A. Simon - 1993 - Artificial Intelligence 59 (1-2):141-146.

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