Origin of the fringe structure observed in high resolution bright-field electron micrographs of amorphous materials

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Philosophical Magazine 33 (6):985-1014 (1976)
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10.1080/14786437608221929

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The structure of amorphous Si and Ge.M. L. Rudee & A. Howie - 1972 - Philosophical Magazine 25 (4):1001-1007.
Electron microscopy of plasmons.J. R. Parsons & C. W. Hoelke - 1974 - Philosophical Magazine 30 (1):135-143.

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