Scanning electron and polarization microscopy study of the variability and character of hollow macro-defects in silicon carbide wafers

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Philosophical Magazine 88 (11):1639-1657 (2008)
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10.1080/14786430802243865

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Ken Nickel
Ambrose University

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References found in this work

Contrast of crystal defects under polarized light.B. K. Tanner & D. J. Fathers - 1974 - Philosophical Magazine 29 (5):1081-1094.
On giant screw dislocations in ZnS polytype crystals.S. Mardix, A. R. Lang & I. Blech - 1971 - Philosophical Magazine 24 (189):683-693.

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