Dislocation structure and the effect of stacking-fault energy in high temperature creep of Cu-Al solid solutions

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Philosophical Magazine 23 (182):303-312 (1971)
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10.1080/14786437108216386

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The determination of dislocation densities in thin films.R. K. Ham - 1961 - Philosophical Magazine 6 (69):1183-1184.

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