Sufficient conditions for the identification of defects which exhibit no generalized cross‐section using computed electron micrographs

&
Philosophical Magazine 35 (4):1037-1047 (1977)
  Copy   BIBTEX

Abstract

This article has no associated abstract. (fix it)

Categories

Add categories

Keywords

Reprint years

DOI

10.1080/14786437708232643

Links

PhilArchive



    Upload a copy of this work     Papers currently archived: 91,783

External links

Setup an account with your affiliations in order to access resources via your University's proxy server

Through your library

My notes

Similar books and articles

Sufficient conditions for the identification of dislocation Burgers vectors using computed electron micrographs.William H. McConnell - 1976 - Philosophical Magazine 33 (5):863-876.
A relation between dark field electron micrographs of lattice defects.C. J. Ball - 1964 - Philosophical Magazine 9 (100):541-544.
Extended vacancy-type defects in silicon induced at low temperatures by electron irradiation.J. Yamasaki, Y. Ohno, S. Takeda & Y. Kimura - 2003 - Philosophical Magazine 83 (2):151-163.
Agency and Moral Realism.Christian Miller - 2004 - Dissertation, University of Notre Dame
Are necessary and sufficient conditions converse relations?Gilberto Gomes - 2009 - Australasian Journal of Philosophy 87 (3):375 – 387.
Stimulated migration of point defects due to electron bombardment in the electron microscope, and its possible effect on their clustering.R. S. Nelson - 1964 - Philosophical Magazine 10 (106):723-726.
Interpretation of electron micrographs and diffraction patterns of amorphous materials.A. Howie, O. L. Krivanek & M. L. Rudee - 1973 - Philosophical Magazine 27 (1):235-255.
The contrast on electron micrographs caused by closely spaced edge dislocation multipoles.P. M. Hazzledixe - 1967 - Philosophical Magazine 15 (133):27-42.
The Logical vs. the Ontological Understanding of Conditions.Rögnvaldur Ingthorsson - 2008 - Metaphysica 9 (2):129-137.
Natural language, sortal reducibility and generalized quantifiers.Edward L. Keenan - 1993 - Journal of Symbolic Logic 58 (1):314-325.
Origin of the fringe structure observed in high resolution bright-field electron micrographs of amorphous materials.W. Krakow, D. G. Ast, W. Goldfarb & B. M. Siegel - 1976 - Philosophical Magazine 33 (6):985-1014.
Automorphisms moving all non-algebraic points and an application to NF.Friederike Körner - 1998 - Journal of Symbolic Logic 63 (3):815-830.
L’identità Come Pratica Dell’identificazione.Flavia Monceri - 2006 - Teoria 26 (1):137-152.
Total and partial Bivariate Risk Premia: An Extension.Béatrice Rey - 2003 - Theory and Decision 55 (1):59-69.
Some restrictions on simple fixed points of the integers.G. L. McColm - 1989 - Journal of Symbolic Logic 54 (4):1324-1345.

Analytics

Added to PP
2016-06-30

Downloads
15 (#944,758)

6 months
4 (#783,478)

Historical graph of downloads
How can I increase my downloads?

Citations of this work

No citations found.

Add more citations

References found in this work

Add more references