Interface dislocation structures at the onset of coherency loss in nanoscale Ni–Cu bilayer films

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Philosophical Magazine 85 (28):3379-3392 (2005)
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10.1080/14786430500145271

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Strains and rotations in thin deposited films.J. P. Hirth & R. C. Pond - 2010 - Philosophical Magazine 90 (23):3129-3147.

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