Systematic errors in dislocation densities measured by thin film electron microscopy

&
Philosophical Magazine 14 (127):185-187 (1966)
  Copy   BIBTEX

Abstract

This article has no associated abstract. (fix it)

Categories

Add categories

Keywords

Reprint years

DOI

10.1080/14786436608219000

Links

PhilArchive



    Upload a copy of this work     Papers currently archived: 91,202

External links

Setup an account with your affiliations in order to access resources via your University's proxy server

Through your library

My notes

Similar books and articles

On dislocation loss in thin film electron microscopy of polycrystalline copper.C. T. B. Foxon & J. G. Rider - 1968 - Philosophical Magazine 17 (148):729-734.
A systematic error in the determination of dislocation densities in thin films.R. K. Ham & N. G. Sharpe - 1961 - Philosophical Magazine 6 (69):1193-1194.
Schattenbilder: Zur elektronenmikroskopischen Photographie in den Biowissenschaften†.Olaf Breidbach - 2005 - Berichte Zur Wissenschaftsgeschichte 28 (2):160-171.
Strain fields around dislocation arrays in a Σ9 silicon bicrystal measured by scanning transmission electron microscopy.Martin Couillard, Guillaume Radtke & Gianluigi A. Botton - 2013 - Philosophical Magazine 93 (10-12):1250-1267.
Cyclic deformation of polycrystalline Cu films.R. Schwaiger, G. Dehm & O. Kraft - 2003 - Philosophical Magazine 83 (6):693-710.
Transmission electron microscopy study of the interaction between a glide dislocation and a dislocation node.R. J. McCabe, A. Misra & T. E. Mitchell - 2003 - Philosophical Magazine 83 (36):4123-4129.
The determination of dislocation densities in thin films.R. K. Ham - 1961 - Philosophical Magazine 6 (69):1183-1184.
On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy.Sławomir Kret, Paweł Dłużewski, Piotr Dłużewski & Jean-Yves Laval - 2003 - Philosophical Magazine 83 (2):231-244.
Atomic force microscopy , transmission electron microscopy and scanning electron microscopy of nanoscale plate-shaped second phase particles.I. Sobchenko, J. Pesicka, D. Baither, W. Stracke, T. Pretorius, L. Chi, R. Reichelt & E. Nembach - 2007 - Philosophical Magazine 87 (17):2427-2460.
Electron microscopy evidence of plasmon-dislocation interactions.D. R. Spalding - 1976 - Philosophical Magazine 34 (6):1073-1082.
Interference Effects in the Electron Microscopy of Thin Crystal Foils.W. Bollmann - 2006 - Philosophical Magazine 86 (29-31):4573-4574.
Characterization of small perfect dislocation loops by transmission electron microscopy.C. M. Van Der Walt - 1972 - Philosophical Magazine 26 (5):1237-1237.
The analysis of dislocation structures in tungsten carbide by electron microscopy.T. Johannesson & B. Lehtinen - 1971 - Philosophical Magazine 24 (191):1079-1085.
Electron microscopy of helical filaments: rediscovering buried treasures in negative stain.Edward H. Egelman & Linda A. Amos - 2009 - Bioessays 31 (9):909-911.
Characterization of small perfect dislocation loops by transmission electron microscopy.D. M. Maker & B. L. Eyre - 1972 - Philosophical Magazine 26 (5):1233-1235.

Analytics

Added to PP
2016-06-30

Downloads
13 (#973,701)

6 months
5 (#526,961)

Historical graph of downloads
How can I increase my downloads?

Citations of this work

Add more citations

References found in this work

On the loss of dislocations during the preparation of a thin film.R. K. Ham - 1962 - Philosophical Magazine 7 (79):1177-1182.

View all 6 references / Add more references