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  1. The character of micropipes in silicon carbide crystals.William M. Vetter & Michael Dudley - 2006 - Philosophical Magazine 86 (9):1209-1225.
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  • A rapid method for obtaining electron microscope contrast maps of various lattice defects.A. R. Thölén - 1970 - Philosophical Magazine 22 (175):175-182.
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  • Experiments on the deformation of niobium single crystals.G. Taylor & J. W. Christian - 1967 - Philosophical Magazine 15 (137):893-929.
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  • Partial dislocations associated with NbC precipitation in austenitic stainless steels.Jeanne M. Silcock & W. J. Tunstall - 1964 - Philosophical Magazine 10 (105):361-389.
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  • Direct observation of dislocations in polyethylene crystals.J. Petermann & H. Gleiter - 1972 - Philosophical Magazine 25 (4):813-816.
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  • Dislocation arrays in Cu-Al alloys. I.C. S. Pande & P. M. Hazzledine - 1971 - Philosophical Magazine 24 (191):1039-1057.
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  • Slip systems in NiAl single crystals at 300°K and 77°K.M. H. Loretto & R. J. Wasilewski - 1971 - Philosophical Magazine 23 (186):1311-1328.
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  • Identification of grain boundary dislocations.P. Humble & C. T. Forwood - 1975 - Philosophical Magazine 31 (5):1011-1023.
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  • 50 Years of TEM of dislocations: Past, present and future.P. Hirsch, D. Cockayne, J. Spence & M. Whelan - 2006 - Philosophical Magazine 86 (29-31):4519-4528.
    The first observations of dislocations by TEM were published in 1956. Since then the technique has been developed into an indispensable tool for the materials scientist, not only for the characterization of the extended defect structure of materials, but also for the elucidation of the mechanisms controlling their properties. To mark the 50th anniversary of the original work, this Special Issue consists of reprints of the three original papers and some 22 current state-of-the-art articles, which provide a snapshot of the (...)
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  • The deformation of magnesium single crystals.P. B. Hirsch & J. S. Lally - 1965 - Philosophical Magazine 12 (117):595-648.
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  • Determination of the sign of screw dislocations viewed end-on by weak-beam diffraction contrast.P. B. Hirsch, Z. Zhou & D. J. H. Cockayne - 2007 - Philosophical Magazine 87 (34):5421-5434.
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  • Intersecting faults on basal and prismatic planes in aluminium nitride.C. M. Drum - 1965 - Philosophical Magazine 11 (110):313-334.
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  • Adf stem imaging of screw dislocations viewed end-on.E. C. Cosgriff, P. D. Nellist, P. B. Hirsch, Z. Zhou & D. J. H. Cockayne - 2010 - Philosophical Magazine 90 (33):4361-4375.
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  • The atomic and electronic structure of dislocations in Ga-based nitride semiconductors.I. Belabbas, P. Ruterana, J. Chen & G. Nouet - 2006 - Philosophical Magazine 86 (15):2241-2269.
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