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  1. Rate equation approaches to thin film nucleation kinetics.J. A. Venables - 1973 - Philosophical Magazine 27 (3):697-738.
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  • Electron microscope study of electrically active impurity precipitate defects in silicon.A. G. Cullis & L. E. Katz - 1974 - Philosophical Magazine 30 (6):1419-1443.