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  1. The analysis of field-ion micrographs: Stacking faults in tungsten.D. A. Smith & K. M. Bowkett - 1968 - Philosophical Magazine 18 (156):1219-1233.
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  • Dissociated perfect dislocations in the field-ion image.D. A. Smith, T. F. Page & B. Ralph - 1969 - Philosophical Magazine 19 (158):231-240.
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  • Characterization of stacking faults with the field-ion microscope.M. A. Fortes - 1970 - Philosophical Magazine 22 (176):317-327.
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