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  1. Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires.B. Yang, C. Motz, M. Rester & G. Dehm - 2012 - Philosophical Magazine 92 (25-27):3243-3256.
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  • Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-rayμLaue diffraction.C. Kirchlechner, W. Grosinger, M. W. Kapp, P. J. Imrich, J. -S. Micha, O. Ulrich, J. Keckes, G. Dehm & C. Motz - 2012 - Philosophical Magazine 92 (25-27):3231-3242.
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